Assoc. Prof. Petr Hlubina, Ph.D.


  • Papers in journals with impact factor
  • Papers in international journals
  • Papers in national journals
  • Papers in international conference proceedings
  • Papers in national conference proceedings and so on

  • Papers in journals with impact factor


    2020

    URBANCOVA, P., CHYLEK, J., HLUBINA, P., PUDIS, D.: Guided-Mode Resonance-Based Relative Humidity Sensing Employing a Planar Waveguide Structure. Sensors, 20, 2020, 6788.

    GRYGA, M., CIPRIAN, D., HLUBINA, P.: Bloch surface wave resonance based sensors as an alternative to surface plasmon resonance sensors. Sensors, 20, 2020, 5119.

    GRYGA, M., CIPRIAN, D., HLUBINA, P.: Guided-mode resonance based humidity sensing using a multilayer dielectric structure. Optics Express, 28, 2020, 28954-28960.

    URBANCOVA, P., GORAUS, M., PUDIS, D., HLUBINA, P., KUZMA, A., JANDURA, D., DURISOVA, J., MICEK, P.: 2D polymer/metal structures for surface plasmon resonance. Applied Surface Science, 530, 2020, 147279.

    KANOK, R., CIPRIAN, D., HLUBINA, P.: Surface plasmon resonance-based sensing utilizing spatial phase modulation in an imaging interferometer. Sensors, 20, 2020, 1616.

    GRYGA, M., CIPRIAN, D., HLUBINA, P.: Sensing concept based on Bloch surface waves and wavelength interrogation. Opt. Lett., 45, 2020, 1096-1099.

    2019

    HLUBINA, P., URBANCOVA, P., PUDIS, D., GORAUS, M., JANDURA, D., CIPRIAN, D.: Ultrahigh-sensitive plasmonic sensing of gas using a two-dimensional dielectric grating. Opt. Lett., 44, 2019, 5602–5605.

    GRYGA, M., VALA, D., KOLEJAK, P., GEMBALOVA, L., CIPRIAN, D., HLUBINA, P.: One-dimensional photonic crystal for Bloch surface waves and radiation modes based sensing. Opt. Mater. Express, 9, 2019, 4009-4022.

    HLUBINA, P ., LUNACKOVA, M., CIPRIAN, D.: Phase sensitive measurement of the wavelength dependence of the complex permittivity of a thin gold film using surface plasmon resonance, Opt. Mater. Express, 9, 2019, 992-1001.

    Papers in international conference proceedings

    GRYGA, M., CIPRIAN, D., GEMBALOVÁ, L., HLUBINA, P.: Sensing of gaseous analytes via Bloch surface waves. In: Proceedings of SPIE (Optical Sensing and Detection VI), 11354, Bellingham 2020, 113541B.

    KANOK, R., CIPRIAN, D., HLUBINA, P.: Surface plasmon resonance detection based on a phase method in the spatial domain. In Proceedings of SPIE (Optical Sensing and Detection VI), 11354, Bellingham 2020, 113542H.

    GRYGA, M., CIPRIAN, D., HLUBINA, P.: Sensing of gaseous analytes via Bloch surface waves. In: Proceedings of SPIE (Optical Sensors 2019), 11028, Bellingham 2019, 110281P.

    2018

    CHLEBUS, R., CHYLEK, J., CIPRIAN, D., HLUBINA, P.: Surface plasmon resonance based measurement of the dielectric function of a thin metal film. Sensors, 18, 2018 No. 11, 3693.

    MICHALSKA, M., GRZES, P., HLUBINA, P., SWIDERSKI, J.: Mid-infrared supercontinuum generation in a fluoroindate fiber with 1.4 W time-averaged power, Laser Phys. Lett., 15, 2018, 045101.

    2017

    HLUBINA, P., CIPRIAN, D.: Spectral Phase Shift of Surface Plasmon Resonance in the Kretschmann Configuration: Theory and Experiment, Plasmonics, 12, 2017, s. 1071-1078.

    MICHALSKA, M., HLUBINA, P., SWIDERSKI, J.: Mid-infrared Supercontinuum Generation to 4.7 um in a ZBLAN Fiber Pumped by an Optical Parametric Generator, IEEE Phot. J., 9, 2017, 3200207.

    MILITKÝ, J., KADULOVÁ, M., CIPRIAN, D., HLUBINA, P.: Fiber optic temperature sensing with enhanced sensitivity based on spectral interferometry, Opt. Fiber Technol., 33, 2017, s.45-50.

    2016

    LUŇÁČEK, J., HLUBINA, P., CIPRIAN, D., DULIAKOVÁ, M., LUŇÁČKOVÁ, M.: Surface plasmon resonance based sensing of aqueous solutions using spectral interferometry. Acta Phys. Pol. A, 129, 2016 č. 1, s. 23–27.

    MILITKÝ, J., KADULOVÁ, M., HLUBINA, P., Highly sensitive displacement measurement based on spectral interferometry and Vernier effect. Opt. Commun., 366, 2016, s. 335-339.

    2015

    HLUBINA, P., DULIAKOVÁ, M., KADULOVÁ, M., CIPRIAN, D., Spectral interferometry-based surface plasmon resonance sensor. Opt. Commun., 354, 2015, s. 240-245.

    HLUBINA, P., KADULOVÁ, M., CIPRIAN, D., MERGO, P.: Temperature sensing using the spectral interference of polarization modes in a highly birefringent fiber. Opt. Lasers Eng., 70, 2015, s. 51-56.

    2014

    HLUBINA, P., KADULOVÁ, M., CIPRIAN, D., SOBOTA, J.: Reflection-based fibre-optic refractive index sensor using surface plasmon resonance. J. Europ. Opt. Soc. Rap. Public., 9, 2014, 14033.

    2013

    HLUBINA, P., KADULOVÁ, M., MERGO, P.: Chromatic dispersion measurement of holey fibres using a supercontinuum source and a dispersion balanced interferometer. Opt. Lasers Eng., 51, 2013, s. 421-425.

    CIPRIAN, D., HLUBINA, P.: Theoretical model of the influence of oxide overlayer thick-ness on the performance of a surface plasmon fibre-optic sensor, Meas. Sci. Technol., 24, 2013 č. 2, 025105.

    HLUBINA, P., MARTYNKIEN, T., OLSZEWSKI, J., MERGO, P., MAKARA, M., POTURAJ, K., URBANCZYK, W.: Spectral-domain measurements of birefringence and sensing characteristics of a side-hole microstructured fiber. Sensors, 13, 2013 č. 9, s. 11424-11438.

    2012

    HLUBINA, P., OLSZEWSKI, J.: Phase retrieval from spectral interferograms including a stationary-phase point. Opt. Commun., 285, 2012, s. 4733-4738.

    HLUBINA, P., OLSZEWSKI, J., MARTYNKIEN, T., MERGO, P., MAKARA, M., POTURAJ, K., URBANCZYK, W.: Spectral-domain measurement of strain sensitivity of a two-mode birefringent side-hole fiber. Sensors, 12, 2012 č. 9, s. 12070-12081.

    HLUBINA, P., KADULOVÁ, M., CIPRIAN, D.: Spectral interferometry-based chromatic dispersion measurement of fibre including the zero-dispersion wavelength. J. Eur. Opt. Soc. – Rap. Publ., 7, 2012, 12017.

    2011

    SZCZUROWSKI, M., URBANCZYK, W., NAPIORKOWSKI, M., HLUBINA, P., HOLLENBACH, U., SIEBER, H., MOHR, J.: Differential Rayleigh scattering method for measurement of polarization and intermodal beat length in optical waveguides and fibers. Applied Optics, 50, 2011 č. 17, s. 2594-2600.

    HLUBINA, P., CIPRIAN, D.: Birefringence dispersion in a quartz crystal retrieved from a channeled spectrum resolved by a fiber-optic spectrometer. Optics Communications, 284, 2011 č. 12, s. 2683-2686.

    2010

    HLUBINA, P., CIPRIAN, D., LUŇÁČEK, J.: Spectral interferometric technique to measure the relative phase change on reflection from a thin-film structure. Applied Physics B, 101, 2010 č. 4, s. 869-873.

    HLUBINA, P., LUŇÁČEK, J., CIPRIAN, D.: White-light spectral interferometric technique to measure a nonlinear phase function of a thin-film structure. Optics Communications, 283, 2010 č. 24, s. 4877-4881.

    HLUBINA, P., CIPRIAN, D.: Absolute phase birefringence dispersion in polarization-maintaining fiber or birefringent crystal retrieved from a channeled spectrum. Optics Letters, 35, 2010 č. 10, s. 1566-1568.

    HLUBINA, P., LUŇÁČEK, J., CIPRIAN, D.: Maxima of the spectral reflectance ratio of polarized waves used to measure the thickness of a nonabsorbing thin film. Optics and Lasers in Engineering, 48, 2010 č. 7-8, s. 786-791.

    HLUBINA, P., MARTYNKIEN, T., CIPRIAN, D., WOJCIK, J., URBANCZYK, W.: Broad spectral range measurements and modelling of birefringence dispersion in two-mode elliptical-core fibres. Journal of Optics, 12, 2010 č. 3, 035405, 8 s.

    HLUBINA, P., CIPRIAN, D., KADULOVÁ, M.: Measurement of chromatic dispersion of polarization modes in optical fibres using white-light spectral interferometry. Measurement Science and Technology, 21, 2010 č. 4, 045302, 7 s.

    2009

    HLUBINA, P., CIPRIAN, D, LUŇÁČEK, J.: Spectral interferometric technique to measure ellipsometric phase of a thin-film structure. Optics Letters, 34, 2009 č. 17, s. 2661-2663.

    HLUBINA, P., LUŇÁČEK, J., CIPRIAN, D.: Spectral interferometry and reflectometry used for characterization of a multilayer mirror. Optics Letters, 34, 2009 č. 10, s. 1564-1566.

    HLUBINA, P., LUŇÁČEK, J., CIPRIAN, D.: The effect of silicon substrate on thickness of SiO2 thin film analysed by spectral reflectometry and interferometry. Applied Physics B, 2009 č. 5, s. 985-989.

    LUŇÁČEK, J., HLUBINA, P., LUŇÁČKOVÁ, M.: A simple method for determination of the thickness of a non-absorbing thin film using spectral reflectance measurement. Applied Optics, 48, 2009 č. 4, s. 795-799.

    HLUBINA, P., CIPRIAN, D., KADULOVÁ, M.: Wide spectral range measurement of modal birefringence in polarization-maintaining fibres. Measurement Science and Technology, 20, 2009 č. 2, 025301, 5 s.

    CHLEBUS, R., HLUBINA, P., CIPRIAN, D.: Spectral-domain tandem interferometry to measure the group dispersion of optical samples. Optics and Lasers in Engineering, 47, 2009 č. 1, s. 173-179.

    2008

    HLUBINA, P., LUŇÁČEK, J., CIPRIAN, D., CHLEBUS, R.: Dispersion error of a beam splitter cube in white-light spectral interferometry. Opto-Electronics Review, 16, 2008 č.4, s. 439-443.

    HLUBINA, P., LUŇÁČEK, J., CIPRIAN, D., CHLEBUS, R.: Spectral interferometry and reflectometry used to measure thin films. Applied Physics B, 92, 2008 č. 2, s. 203-207.

    HLUBINA, P., CIPRIAN, D., CHLEBUS, R.: Group index dispersion of holey fibres measured by a white-light spectral interferometric technique. Optics Communications, 281, 2008 č. 15-16, s. 4008-4013.

    HLUBINA, P., LUŇÁČEK, J., CIPRIAN, D., CHLEBUS, R.: Windowed Fourier transform applied in the wavelength domain to process the spectral interference signals. Optics Communications, 281, 2008 č. 9, s. 2349-2354.

    2007

    HLUBINA, P., CIPRIAN, D.: Spectral-domain measurement of phase modal birefringence in polarization-maintaining fiber. Optics Express, 15, 2007 č. 25, s. 17019-17024.

    HLUBINA, P., SZPULAK, M., CIPRIAN, D., MARTYNKIEN, T., URBANCZYK, W.: Measurement of the group dispersion of the fundamental mode of holey fiber by white-light spectral interferometry. Optics Express, 15, 2007 č. 18, s. 11073-11081.

    HLUBINA, P., CIPRIAN, D., LUŇÁČEK, J., CHLEBUS, R.: Phase retrieval from the spectral interference signal used to measure thickness of SiO2 thin film on silicon wafer. Applied Physics B, 88, 2007 č.3, s. 397-403.

    CHLEBUS, R., HLUBINA, P., CIPRIAN, D.: Direct measurement of group dispersion of optical components using white-light spectral interferometry. Opto-Electronics Review, 15, 2007 č. 3, s. 144-148.

    HLUBINA, P., CIPRIAN, D., LUŇÁČEK, J.: Dispersive white-light spectral interferometry including the effect of thin-film for distance measurement. Optik, 118, 2007 č. 7, s. 319-324.

    HLUBINA, P., CHLEBUS, R., CIPRIAN, D.: Differential group refractive index dispersion of glasses of optical fibres measured by a white-light spectral interferometric technique. Measurement Science and Technology, 18, 2007 č. 5, s. 1547-1552.

    HLUBINA, P., CIPRIAN, D., KNYBLOVÁ, L.: Direct measurement of dispersion of the group refractive indices of quartz crystal by white-light spectral interferometry. Optics Communications, 269, 2007 č. 1, s. 8-13.

    2006

    HLUBINA, P., CIPRIAN, D., LUŇÁČEK, J., LESŇÁK, M.: Dispersive white-light spectral interferometry with absolute phase retrieval to measure thin film. Optics Express, 14, 2006 č. 17, s. 7678-7685.

    HLUBINA, P., CIPRIAN, D., LUŇÁČEK, J., LESŇÁK, M.: Thickness of SiO2 thin film on silicon wafer measured by dispersive white-light spectral interferometry. Applied Physics B, 84, 2006 č. 3, s. 511-516.

    HLUBINA, P., CIPRIAN, D., KNYBLOVÁ, L.: Interference of white light in tandem configuration of birefringent crystal and sensing birefringent fiber. Optics Communications, 260, 2006 č. 2, s. 535-541.

    HLUBINA, P., SZPULAK, M., KNYBLOVÁ, L., STATKIEWICZ, G., MARTYNKIEN, T., CIPRIAN, D., URBAŃCZYK, W.: Measurement and modelling of dispersion characteristics of two-mode birefringent holey fibre. Measurement Science and Technology, 17, 2006 č. 4, s. 626-630.

    2005

    HLUBINA, P.: Spectral-domain intermodal interference and the effect of a low-resolution spectrometer. Optik, 116, 2005 č. 10, s. 469-474.

    HLUBINA, P.: White-light spectral interferometry to measure the effective thickness of optical elements of known dispersion. Acta Physica Slovaca, 55, 2005 č. 4, s. 387-393.

    HLUBINA, P.: Interference of white light analysed at the output of a birefringent crystal by a fibre-optic spectrometer. Optics Communications, 251, 2005 č. 4-6, s. 367-375.

    HLUBINA, P., URBAŃCZYK, W.: Dispersion of the group birefringence of a calcite crystal measured by white-light spectral interferometry. Measurement Science and Technology, 16, 2005 č. 6, s. 1267-1271.


    Papers in international journals


    CIPRIAN, D., HLUBINA, P.: Analysis of nanoparticle-based surface plasmon resonance fiber optic sensor. In: Key Engineering Materials, 605, 2014, s. 131-134.

    LUŇÁČEK, J., HLUBINA, P., LESŇÁK, M., CIPRIAN, D. LUŇÁČKOVÁ, M.: Surface plasmon resonance sensor using spectral interference. Advanced Science, Engineering and Medicine, 5, 2013 č.6, s. 577-580.


    Papers in national journals


    LUŇÁČKOVÁ, M., LUŇÁČEK, J., HLUBINA, P., POTUČEK, Z.: Určení tloušťky tenké vrstvy z měření spektrální odrazivosti pomocí nové varianty obálkové metody. Jemná mechanika a optika, 54, 2009 č. 6, s. 188-191.

    KADULOVÁ, M., HLUBINA, P., CIPRIAN, D., STATKIEWICZ-BARABACH, G., URBANCZYK, W.: Měření disperze dvojlomu ve dvouvidovém mikrostrukturním optickém vlákně pomocí spektrální interferometrie v bílém světle. Jemná mechanika a optika, 54, 2009 č. 6, s. 176-178.

    CIPRIAN, D., HLUBINA, P., KADULOVÁ, M.: Měření koeficientu chromatické disperze metodou spektrální interferometrie. Jemná mechanika a optika, 54, 2009 č. 6, s. 168-172.

    LUŇÁČKOVÁ, M., LUŇÁČEK, J., CIPRIAN, D., HLUBINA, P.: Vliv použitého modelu odrazivosti na určení velikosti tloušťky tenké vrstvy. Jemná mechanika a optika, 53, 2008 č. 11-12, s. 293-295.

    CHLEBUS, R., HLUBINA, P.: Měření skupinové disperze optického prvku s využitím spektrální tandemové interferometrie v bílém světle. Jemná mechanika a optika, 53, 2008 č. 7-8, s. 223-226.

    LUŇÁČEK, J., LUŇÁČKOVÁ, M., HLUBINA, P., CIPRIAN, D.: Využití okenní Fourierovy transformace a waveletové transformace k rekonstrukci fáze spektrálního interferenčního signálu. Jemná mechanika a optika, 53, 2008 č. 4, s. 111-114.

    LESŇÁK, M., LUŇÁČEK, J., TALIK, A., HLUBINA, P., PIŠTORA, J.: Úprava elipsometru Gaertner L119 a jeho použití pro studium tenkých vrstev. Jemná mechanika a optika, 52, 2007 č. 2, s. 40-42.

    CHLEBUS, R., LUŇÁČEK, J., HLUBINA, P., CIPRIAN, D., LESŇÁK, M.: Měření tloušťky tenké vrstvy SiO2 na křemíkovém substrátu s využitím spektrální interferometrie v bílém světle. Jemná mechanika a optika, 52, 2007 č. 1, s. 13-16.

    HLUBINA, P., CIPRIAN, D., KNYBLOVÁ L.: Měření disperze skupinového indexu lomu řádné a mimořádné vlny v krystalu křemene pomocí spektrální interferometrie v bílém světle. Jemná mechanika a optika, 51, 2006 č. 5, s. 138-141.

    HLUBINA, P., STATKIEWICZ, G., MARTYNKIEN, T., URBAŃCZYK, W.: Měření disperzních charakteristik vysoce dvojlomného mikrostrukturního optického vlákna interferenčními metodami. Jemná mechanika a optika, 50, 2005 č. 7-8, s. 218-221.

    HLUBINA, P.: Měření disperze dvojlomu krystalu islandského vápence s využitím spektrální interferometrie v bílém světle. Jemná mechanika a optika, 50, 2005 č. 6, s. 196-199.


    Papers in international conference proceedings


    BEZDĚKOVÁ, I., CHLEBUS, R., CIPRIAN, D., HLUBINA, P.: On correction of the resonant condition in the effect of surface plasmon resonance. In: Proceedings of SPIE (21st Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, Lednice 2018), 10976, Bellingham 2018, 1097613, 8 s.

    CHYLEK, J., HLUBINA, P., CIPRIAN, D.: Surface plasmon resonance for air used for characterization of a metallic layer. In: Proceedings of SPIE (21st Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, Lednice 2018), 10976, Bellingham 2018, 1097606, 7 s.

    KAŇOK, R., CHLEBUS, R., CIPRIAN, D., HLUBINA, P.: Sensing of liquid analytes using surface plasmon resonance at different angles of incidence. In: Proceedings of SPIE (21st Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, Lednice 2018), 10976, Bellingham 2018, 109760P, 8 s.

    KAŇOK, R., BEZDĚKOVÁ, I., CIPRIAN, D., HLUBINA, P.: Sensing of liquid analytes via the phase shift induced by surface plasmon resonance. In: Proceedings of SPIE (SPIE Photonics Europe: Optical Sensing and Detection V, Štrasburk 2018), 10680, Bellingham 2018, 106801Q, 8 s.

    CHYLEK, J., BEZDĚKOVÁ, I., CIPRIAN, D., HLUBINA, P.: Measurement of the dispersion of a liquid analyte using surface plasmon resonance: a theoretical approach. In: Proceedings of SPIE (SPIE Photonics Europe: Optical Sensing and Detection V, Štrasburk 2018), 10680, Bellingham 2018, 106801R, 8 s.

    MILITKÝ, J., KADULOVÁ, M., HLUBINA, P.: Spectral interferometric fiber optic temperature sensor with enhanced sensitivity. In: Proceedings of SPIE (20th Slovak-Czech-Polish Optical Conference: Wave and Quantum Aspects of Contemporary Optics, Jasná 2016), 10142, Bellingham 2016, 101421U, 6 s.

    DULIAKOVÁ, M., HLUBINA, P., CIPRIAN, D., Spectral phase-shift detection of surface plasmon resonance. In: Proceedings of SPIE (20th Slovak-Czech-Polish Optical Conference: Wave and Quantum Aspects of Contemporary Optics, Jasná 2016), 10142, Bellingham 2016, 1014212, 7 s.

    MILITKÝ, J., KADULOVÁ, M., CIPRIAN, D., HLUBINA, P.: Highly sensitive displacement measurement utilizing the wavelength interrogation. In: Proceedings of SPIE (Optical Systems Design 2015, Jena), 9628, Bellingham 2015, 96281W, 8 s.

    MILITKÝ, J., KADULOVÁ, M., CIPRIAN, D., HLUBINA, P.: Highly birefringent fiber-based temperature sensor utilizing the wavelength interrogation. In: Proceedings of SPIE (Optical Sensors 2015, Prague), 9506, Bellingham 2015, 95061I, 8 s.

    CIPRIAN, D., KADULOVÁ, M., HLUBINA, P., MERGO, P.: Temperature sensing using the spectral interference of polarization modes of a highly birefringent fiber. In: Proceedings of SPIE (Photonics Prague, Prague 2014), 9450, Bellingham 2015, 94500E, 8 s.

    HLUBINA, P., CIPRIAN, D., KADULOVÁ, M.: Fiber-optic refractive index sensor based on surface plasmon resonance. In: Proceedings of SPIE (Photonics Prague, Prague 2014), 9450, Bellingham 2015, 94500A, 8 s.

    CIPRIAN, D., HLUBINA, P.: Model of a double-sided surface plasmon resonance fiber-optic sensor. In: Proceedings of SPIE (19th Polish-Czech-Slovak Optical Conference, Wilanow 2014), 9441, Bellingham 2014, 94411I, 7 s.

    HLUBINA, P., KADULOVÁ, M., CIPRIAN, D.: Surface plasmon resonance based fiber optic refractive index sensors. In: Proceedings of SPIE (19th Polish-Czech-Slovak Optical Conference, Wilanow 2014), 9441, Bellingham 2014, 94411H, 7 s.

    KADULOVÁ, M., HLUBINA, P., OLSZEWSKI, J., MARTYNKIEN, T., MERGO, P., URBANCZYK, W.: Measurements of intermodal sensitivity of a two-mode holey fiber to strain, temperature and hydrostatic pressure. In: Proceedings of SPIE (Fifth European Workshop on Optical Fibre Sensors, Krakow 2013), 8794, Bellingham 2013, 87940O, 4 s.

    HLUBINA, P., OLSZEWSKI, J., MARTYNKIEN, T., MERGO, P., URBANCZYK, W.: Spectral measurements of polarimetric sensitivity of holey fiber to strain, temperature and hydrostatic pressure. In: Proceedings of SPIE (Fifth European Workshop on Optical Fibre Sensors, Krakow 2013), 8794, Bellingham 2013, 87940M, 4 s.

    KADULOVÁ, M., HLUBINA, P., CIPRIAN, D.: Measurement of chromatic dispersion and dispersion slope of fiber using a supercontinuum source. In: Proceedings of SPIE (Micro-structured and Specialty Optical Fibres II, Prague 2013), 8775, Bellingham 2013, 87750X, 6 s.

    HLUBINA, P., OLSZEWSKI, J., MARTYNKIEN, T., MERGO, P., URBANCZYK, W.: Spectral-domain measurement of polarimetric sensitivity of a side-hole fiber to temperature and hydrostatic pressure. In: Proceedings of SPIE (Optical Sensors 2013, Prague 2013), 8774, Bellingham 2013, 877407, 8 s.

    CIPRIAN, D., HLUBINA, P.: Metal oxide layer influence on the sensitivity of SPR fiber optic sensor. In: Proceedings of SPIE (18th Czech-Polish-Polish Optical Conference: Wave and Quantum Aspects of Contemporary Optics, Sepetná 2012), 8697, Bellingham 2012, 86971N, 9 s.

    KADULOVÁ, M., HLUBINA, P., CIPRIAN, D.: Zero-dispersion wavelength measurement of fiber polarization modes using a supercontinuum source. In: Proceedings of SPIE (18th Czech-Polish-Polish Optical Conference: Wave and Quantum Aspects of Contemporary Optics, Sepetná 2012), 8697, Bellingham 2012, 86971E, 9 s.

    HLUBINA, P., OLSZEWSKI, J., MARTYNKIEN, T., MERGO, P., MAKARA, M., POTURAJ, K., URBANCZYK, W.: Spectral-domain measurement of strain sensitivity of a two-mode birefringent holey fiber. In: Proceedings of SPIE (18th Czech-Polish-Polish Optical Conference: Wave and Quantum Aspects of Contemporary Optics, Sepetná 2012), 8697, Bellingham 2012, 86971D, 9 s.

    CIPRIAN, HLUBINA, P.: Simulation of surface plasmon fiber-optic sensor including the effect of oxide overlayer thickness change. In: Proceedings of SPIE (Optical Sensing and Detection II, Brussels 2012), 8439, Bellingham 2012, 843927, 11 s.

    HLUBINA, P., CIPRIAN, D., KADULOVÁ, M., MARTYNKIEN, T., MERGO, P., URBANCZYK, W.: Spectral interferometry-based dispersion characterization of microstructured and specialty optical fibers using a supercontinuum source. In: Proceedings of SPIE (Microstructured and Specialty Optical Fibres, Brussels 2012), 8426, Bellingham 2012, 84260N, 13 s.

    CIPRIAN, D., HLUBINA, P.: Modeling of a fiber-optic sensor based on surface plasmon resonance including the dispersion of the analyte. In: Proceedings of SPIE (Photonic Prague 2011, Prague 2011), 8306, Bellingham 2011, 830612, 9 s

    HLUBINA, P., LUŇÁČEK, J., CIPRIAN, D.: Spectral polarimetry-based measurement of the thickness of a thin film. In: Proceedings of SPIE (Optical Measurement Systems for Industrial Inspection, Munich 2011), 8082, Bellingham 2011, 80822T, 8 s.

    HLUBINA, P., CIPRIAN, D., MARTYNKIEN, T., MERGO, P., URBANCZYK, W.: Broad spectral range measurement of chromatic dispersion of polarization modes in holey fibers using spectral interferometry. In: Proceedings of SPIE (Optical Measurement Systems for Industrial Inspection, Munich 2011), 8082, Bellingham 2011, 80820T, 9 s.

    KADULOVÁ, M., HLUBINA, P., CIPRIAN, D., MARTYNKIEN, T., MERGO, P., URBANCZYK, W.: Measurement of chromatic dispersion of polarization modes in holey fibers by white-light spectral interferometric techniques. In: Proceedings of SPIE (Optics and Optoelectronics: Photonic Crystal Fibres, Prague 2011), 8073, Bellingham 2011, 80732L, 9 s.

    HLUBINA, P., CIPRIAN, D., LUŇÁČEK, J.: Spectral ellipsometry based on a channeled spectrum detection to measure the thickness of a thin film. In: Proceedings of SPIE (17th Slovak-Czech-Polish Optical Conference: Wave and Quantum Aspects of Contemporary Optics, Liptovský Ján 2010), 7746, Bellingham 2010, 77461H, 8 s.

    HLUBINA, P., CIPRIAN, D., KADULOVÁ, M., MARTYNKIEN, T., URBANCZYK, W.: Measurement of dispersion characteristics of two-mode birefringent optical fibers by spectral interferometric techniques. In: Proceedings of SPIE (17th Slovak-Czech-Polish Optical Conference: Wave and Quantum Aspects of Contemporary Optics, Liptovský Ján 2010), 7746, Bellingham 2010, 77460D, 11 s.

    HLUBINA, P., CIPRIAN, D., KADULOVÁ, M., MARTYNKIEN, T., URBANCZYK, W.: Broad spectral range measurement of chromatic dispersion of polarization modes in holey fibers by interferometric techniques. In: Proceedings of SPIE (Photonic Crystal Fibers IV, Brussels 2010), 7714, Bellingham 2010, 77140Z, 9 s.

    HLUBINA, P., LUŇÁČEK, J., CIPRIAN, D.: White-light spectral interferometry and reflectometry to measure thickness of thin films. In: Proceedings of SPIE (Optical Measurement Systems for Industrial Inspection VI, Munich 2009), 7389, Bellingham 2009, 738926, 8 s.

    HLUBINA, P., CIPRIAN, D., FROSZ, M. H., NIELSEN, K.: Measurement of chromatic dispersion of microstructured polymer fibers by white-light spectral interferometry. In: Proceedings of SPIE (Optical Measurement Systems for Industrial Inspection VI, Munich 2009), 7389, Bellingham 2009, 73890J, 9 s.

    FROSZ, M. H., NIELSEN, K., HLUBINA, P., STEFANI, A., BANG, O.: Dispersion-engineered and highly nonlinear microstructured polymer optical fibres. In: Proceedings of SPIE (Optics and Optoelectronics: Photonic Crystal Fibres, Prague 2009), 7357, Bellingham 2009, 735705, 9 s.

    KADULOVÁ, M., HLUBINA, P., CIPRIAN, D., STATKIEWICZ-BARABACH, G., URBANCZYK, W., WOJCIK, J.: Birefringence dispersion in elliptical-core fibers measured over a broad wavelength range by interferometric techniques. In: Proceedings of SPIE (Optics and Optoelectronics: Photonic Crystal Fibres, Prague 2009), 7357, Bellingham 2009, 73570C, 8 s.

    HLUBINA, P., CIPRIAN, D., KADULOVÁ, M., STATKIEWICZ-BARABACH, G., URBANCZYK, W.: Broadband measurement of dispersion in a two-mode birefringent holey fiber by spectral interferometric techniques. In: Proceedings of SPIE (Optics and Optoelectronics: Photonic Crystal Fibres, Prague 2009), 7357, Bellingham 2009, 73570A, 9 s.

    HLUBINA, P., LUŇÁČEK, J., CIPRIAN, D., LUŇÁČKOVÁ, M.: Measuring small thickness changes of a thin film by white-light spectral interferometry. In: Proceedings of SPIE (Optics and Optoelectronics: Optical Sensors, Prague 2009), 7356, Bellingham 2009, 735618, 8 s.

    HLUBINA, P., CIPRIAN, D., CHLEBUS, R.: Spectral-domain interferometric technique used to measure group index dispersion of holey fibers. In: Proceedings of SPIE (Photonics Prague 2008, Prague 2008), 7138, Bellingham 2008, 713815, 5 s.

    CHLEBUS, R., HLUBINA, P., CIPRIAN, D.: Tandem interferometry used to measure the group dispersion of optical components. In: Proceedings of SPIE (16th Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics, Polanica Zdroj 2008), 7141, Bellingham 2008, 71410V, 7 s.

    HLUBINA, P., LUŇÁČEK, J., CIPRIAN, D., CHLEBUS, R.: Variable effective thickness of beamsplitter cube and dispersion error in white-light spectral interferometry. In: Proceedings of SPIE (16th Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics, Polanica Zdroj 2008), 7141, Bellingham 2008, 71410X, 6 s.

    HLUBINA, P., CIPRIAN, D., KADULOVÁ, M.: Measurement of birefringence dispersion in polarization-maintaining fibers by white-light spectral interferometric techniques. In: Proceedings of SPIE (16th Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics, Polanica Zdroj 2008), 7141, Bellingham 2008, 71411L, 6 s.

    HLUBINA, P., LUŇÁČEK, J., CIPRIAN, D., CHLEBUS, R., LUŇÁČKOVÁ, M.: Phase retrieval from the spectral interferograms by windowed Fourier transform. In: Proceedings of SPIE (Photonics Europe: Optical Micro- and Nanotechnology in Microsystems Technology, Strasbourg 2008), 6995, Bellingham 2008, 69550Z, 9 s.

    HLUBINA, P., CIPRIAN, D., TROJKOVÁ, J.: Spectral-domain measurement of phase modal birefringence in highly birefringent fibers. In: Proceedings of SPIE (Photonics Europe: Photonic Crystal Fibres, Strasbourg 2008), 6990, Bellingham 2008, 69900U, 7 s.

    HLUBINA, P., CIPRIAN, D., CHLEBUS, R.: Group dispersion measurement of a holey fiber by white-light spectral interferometry. In: Proceedings of SPIE (Photonics Europe: Photonic Crystal Fibres, Strasbourg 2008), 6990, Bellingham 2008, 69900J, 8 s.

    HLUBINA, P., CIPRIAN, D., CHLEBUS, R.: Differential group index dispersion of a holey fiber measured by white-light spectral interferometry. In: Proceedings of ICTON 2007 (International Conference on Transparent Optical Networks, Rome 2007) IEEE Catalog Number: 07EX1796C, Vol. 4, s. 297-300.

    HLUBINA, P., CIPRIAN, D., CHLEBUS, R.: White-light spectral interferometric techniques used to measure the group dispersion of isotropic and anisotropic optical elements. In: Proceedings of SPIE (Optical Measurement Systems for Industrial Inspection V, Munich 2007), 6616, Bellingham 2007, 66161F, s. 8.

    HLUBINA, P., CIPRIAN, D., CHLEBUS, R., LUŇÁČEK, J., LESŇÁK, M.: White-light spectral interferometric technique used to measure thickness of thin films. In: Proceedings of SPIE (Optical Measurement Systems for Industrial Inspection V, Munich 2007), 6616, Bellingham 2007, 661605, s. 9.

    CHLEBUS, R., HLUBINA, P., CIPRIAN, D., LUŇÁČEK, J.: Measurement of thin films using slightly dispersive spectral interferometry. In: Proceedings of SPIE (Optics and Optoelectronics: Nonlinear Optics and their Applications, Prague 2007), 6582, Bellingham 2007, 65821D, s. 9.

    HLUBINA, P., CIPRIAN, D., TROJKOVÁ, J., STATKIEWICZ, G., MARTYNKIEN, T., URBANCZYK, W.: Specialty optical fibers measured by interferometric techniques. In: Proceedings of SPIE (Optics and Optoelectronics: Photonic Crystal Fibres, Prague 2007), 6588, Bellingham 2007, 658811, s. 7.

    HLUBINA, P., SZPULAK, M., CIPRIAN, D., TROJKOVÁ, J., STATKIEWICZ, G., MARTYNKIEN, T., URBANCZYK, W.: Theoretical and experimental analysis of waveguiding in a two-mode birefringent holey fiber. In: Proceedings of SPIE (Optics and Optoelectronics: Photonic Crystal Fibres, Prague 2007), 6588, Bellingham 2007, 65880K, s. 9.

    HLUBINA, P., CIPRIAN, D., LUŇÁČEK, J., LESŇÁK, M., CHLEBUS, R.: Dispersive white-light spectral interferometry used to measure thickness of a thin film on a substrate. In: Proceedings of SPIE (15th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, Liberec 2006), 6609, Bellingham 2007, 66090X, s. 9.

    CIPRIAN, D., HLUBINA, P., TROJKOVÁ, J.: Dispersion measurements of a birefringent holey fiber using white-light spectral interferometry. In: Proceedings of SPIE (15th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, Liberec 2006), 6609, Bellingham 2007, 66090W, s. 8.

    CHLEBUS, R., HLUBINA, P., CIPRIAN, D.: Dispersion measurements of anisotropic materials and a new fiber-optic sensor configuration. In: Proceedings of SPIE (15th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, Liberec 2006), 6609, Bellingham 2007, 66090H, s. 10.

    HLUBINA, P., CIPRIAN, D., CHLEBUS, R.: White-light spectral interferometry used to measure the group dispersion of isotropic and anisotropic optical materials. In: Proceedings of the Symposium on Photonics Technologies for 7th Framework Program, Wroclaw 2006, s. 529-532.

    HLUBINA, P., CIPRIAN, D., TROJKOVÁ, J., ., STATKIEWICZ, G., MARTYNKIEN, T., URBAŃCZYK, W.: Interferometric techniques used to measure specialty optical fibers. In: Proceedings of the Symposium on Photonics Technologies for 7th Framework Program, Wroclaw 2006, s. 107-110.

    HLUBINA, P., SZPULAK, M., KNYBLOVÁ, L., CIPRIAN, D., MARTYNKIEN, T., STATKIEWICZ, G., URBAŃCZYK, W.: Experimental and theoretical analysis of dispersion characteristics of two-mode birefringent holey fiber. In: Proceedings of SPIE (Photonics Europe: Photonic Crystal Materials and Devices III, Strasbourg 2006), 6182, Bellingham 2006, s. 519-526.

    HLUBINA, P., CIPRIAN, D., KNYBLOVÁ L.: Spectral-domain analysis of white light propagation in new sensor configuration comprising birefringent fiber. In: Proceedings of SPIE (Photonics Europe: Optical Sensing II, Strasbourg 2006), 6189, Bellingham 2006, s. 378-386.

    HLUBINA, P., KNYBLOVÁ L., CIPRIAN, D.: Measurement of dispersion characteristics of a highly birefringent air-silica microstructured fiber. In: Proceedings of 15th Conference of Slovak and Czech Physicists, Košice 2005, 2006, s. 39-40.

    PIŠTORA, J., VLČEK, J., HLUBINA, P., FOLDYNA, M., ŽIVOTSKÝ, O. Total Internal Reflection Ellipsometry of Periodic Structures. In: Proceedings of SPIE (Photonics Prague 2005, Prague 2005), 6180, Bellingham 2006, s. 297-301.

    HLUBINA, P., STATKIEWICZ, G., MARTYNKIEN, T., URBAŃCZYK, W.: Dispersion measurements of the birefringent holey fiber by interferometric methods. In: Proceedings of SPIE (Photonics Prague 2005, Prague 2005), 6180, Bellingham 2006, s. 254-259.

    HLUBINA, P., MARTYNKIEN, T., URBAŃCZYK, W.: Measuring dispersion characteristics of elliptical-core optical fiber using white-light spectral interferometry. In: Proceedings of SPIE (Lightmetry 04, Warsaw 2004), 6158, Bellingham 2006, s. 117-124.

    HLUBINA, P.: Applications of dispersive white-light spectral interferometry in optics. In: Proceedings of SPIE (Lightmetry 04, Warsaw 2004), 6158, Bellingham 2006, s. 25-34.

    HLUBINA, P., CIPRIAN, D., KNYBLOVÁ L.: Two-mode fiber-optic sensors using a white-light spectral interferometric technique. In: Proceedings of SPIE (Optical Fibers: Applications, Warsaw 2005), 5952, Bellingham 2005, s.252-262.

    HLUBINA, P.: Measurement of optical fibers by interferometric methods. In: Proceedings of SPIE (Optical Fibers: Applications, Warsaw 2005), 5952, Bellingham 2005, s.192-203.

    HLUBINA, P., GUROV, I., CHUGUNOV, V.: Measuring the effective thickness of optical elements knowing their dispersion and using white-light spectral interferometry. In: Proceedings of SPIE (14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, Nitra 2004), 5945, Bellingham 2005, s. 112-121.

    HLUBINA, P.: White-light spectral interferometry and its applications in fiber optics. In: Proceedings of SPIE (14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, Nitra 2004), 5945, Bellingham 2005, s.52-63.

    HLUBINA, P.: White-light spectral interferometric technique used to measure the dispersion of the group birefringence of a uniaxial crystal. In: Proceedings of SPIE (Optical Measurement Systems for Industrial Inspection IV, Munich 2005), 5856, Bellingham 2005, s. 410-418.

    GUROV, I., HLUBINA, P., TARANIN, M., ZAKHAROV, A.: Evaluation of spectral modulated interferograms by the extended Kalman filtering method. In: Proceedings of SPIE (Optical Measurement Systems for Industrial Inspection IV, Munich 2005), 5856, Bellingham 2005, s. 274-280.

    POSTAVA, K., HLUBINA, P., MAZIEWSKI, A., OSSIKOVSKI, R., FOLDYNA, M., ŽIVOTSKÝ, O., PIŠTORA, J., VIŠŇOVSKÝ, S., YAMAGUCHI, T.: Influence of component imperfection on null ellipsometry with phase modulation. In: Proceedings of SPIE (Optical Measurement Systems for Industrial Inspection IV, Munich 2005), 5856, Bellingham 2005, s. 143-151.


    Papers in national conference proceedings and so on


    LUŇÁČEK, J., HLUBINA, P., CIPRIAN, D.: White-light spectral interferometric technique to measure a nonlinear phase function of a thin-film structure. In: Annual Proceeding of Science and Technology at VŠB-TUO, 2011, s. 98-101.

    HLUBINA, P., KADULOVÁ, M., CIPRIAN, D.: Birefringence dispersion in fiber or crystal retrieved from a channeled spectrum. In: Annual Proceeding of Science and Technology at VŠB-TUO, 2011, s. 25-28.

    KADULOVÁ, M., HLUBINA, P., CIPRIAN, D.: Zero-dispersion wavelength measurement of polarization modes in a holey fiber by spectral interferometric techniques. In: Proceedings of 7th Conference on Mathematics and Physics at Technical Universities, Brno, 2011, s. 47-56.

    LUŇÁČEK, J., LUŇÁČKOVÁ, M., HLUBINA, P., CIPRIAN, D.: Simulation of a surface plasmon resonance-based refractive index sensor using spectral interference. In: Proceedings of Development of Materials Science in Research and Education, 21th Joint Seminar, August 29 - September 2, 2011, Kežmarské Žlaby, Slovak Expert Group of Solid State Chemistry and Physics, 2011, s. 40-41.

    LUŇÁČEK, J., CIPRIAN, D., HLUBINA, P.: Simulation of a surface plasmon resonance-based fiber-optic refractive index sensor. In: Proceedings of Development of Materials Science in Research and Education, 21th Joint Seminar, August 29 - September 2, 2011, Kežmarské Žlaby, Slovak Expert Group of Solid State Chemistry and Physics, 2011, s. 38-39.

    LUŇÁČEK, J., HLUBINA, P., CIPRIAN, D., LUŇÁČKOVÁ, M.: Measurement of the spectral reflectance ratio of polarized waves used to thin-film thickness determination. In: Annual Proceeding of Science and Technology at VŠB-TUO, 2010, s. 99-102.

    KADULOVÁ, M., HLUBINA, P., CIPRIAN, D., MARTYNKIEN, T., URBANCZYK, W.: Measurement of dispersion characteristics of birefringent optical fibers by interferometric techniques. In: Annual Proceeding of Science and Technology at VŠB-TUO, 2010, s. 58-63.

    CIPRIAN, D., HLUBINA, P., KADULOVÁ, M., MARTYNKIEN, T., URBANCZYK, W.: Broad spectral range chromatic dispersion measurement of birefringent optical fibers. In: Annual Proceeding of Science and Technology at VŠB-TUO, 2010, s. 11-15.

    LUŇÁČKOVÁ, M., LUŇÁČEK, J., POTUČEK, Z., HLUBINA, P.: Alternative method to thin-film thickness determination using the spectral reflectance measurement. Proceedings of Development of Materials Science in Research and Education, 20th Joint Seminar, September 1-3, 2010, Bořetice, Czech and Slovak Association for Crystal Growth, 2010, s. 41-42.

    LUŇÁČEK, J., HLUBINA, P., CIPRIAN, D.: Measurement of the spectral reflectance ratio of polarized waves used to thin-film thickness determination. Proceedings of Development of Materials Science in Research and Education, 20th Joint Seminar, September 1-3, 2010, Bořetice, Czech and Slovak Association for Crystal Growth, 2010, s. 39-40.

    KADULOVÁ, M., HLUBINA, P., CIPRIAN, D.: Dispersion of birefringence in an elliptical-core fiber measured by spectral interferometric techniques. In: Proceedings of 6th Conference on Mathematics and Physics at Technical Universities, Brno, 2009, s. 361-370.

    LUŇÁČEK, J., LUŇÁČKOVÁ, M., POTUČEK, Z., HLUBINA, P.: Thin-film thickness calculation from a spectral reflectance measurement by using a new envelope method. In: Annual Proceeding of Science and Technology at VŠB-TUO, 2009, s. 77-80.

    HLUBINA, P., CIPRIAN, D., KADULOVÁ, M., MARTYNKIEN, T., URBANCZYK, W.: Interferometric measurement of dispersion characteristics of birefringent optical fibers. In: Annual Proceeding of Science and Technology at VŠB-TUO, 2009, s. 44-47.

    CIPRIAN, D., HLUBINA, P., KADULOVÁ, M., FROSZ, M. H., NIELSEN, K.: Measurement of chromatic dispersion of microstructured silica and polymer fibers. In: Annual Proceeding of Science and Technology at VŠB-TUO, 2009, s. 5-9.

    LUŇÁČKOVÁ, M., LUŇÁČEK, J., POTUČEK, Z., HLUBINA, P.: Thin-film thickness determination from a spectral reflectance measurement by using an alternative envelope method. Proceedings of Development of Materials Science in Research and Education, 19th Joint Seminar, August 31 - September 4, 2009, Závažná Poruba, Czech and Slovak Association for Crystal Growth, 2009, s. 92-93.

    LUŇÁČEK, J., HLUBINA, P., CIPRIAN, D., LUŇÁČKOVÁ, M.: Windowed Fourier transform and wavelet transfrom applied to the phase retrieval of the spectral interference signal. In: Annual Proceeding of Science and Technology at VŠB-TUO, 2008, s. 102-105.

    HLUBINA, P., CIPRIAN, D., KADULOVÁ, M.: Measurement of birefringent optical fiber by white-light spetral interferometry. In: Annual Proceeding of Science and Technology at VŠB-TUO, 2008, s. 50-53.

    CIPRIAN, D., HLUBINA, P., CHLEBUS, R.: Measurement of group index dispersion of holey fibres using white-light spectral interferometry. In: Annual Proceeding of Science and Technology at VŠB-TUO, 2008, s. 23-26.

    LUŇÁČEK, J., POTUČEK, Z., LUŇÁČKOVÁ, M., HLUBINA, P., CIPRIAN, D.: Spectral reflectometry of SiO2 thin films on the silicon wafers. In: Proceedings of Development of Materials Science in Research and Education, 18th Joint Seminar, September 1-5, 2008, Hnanice, Czech and Slovak Association for Crystal Growth, 2008, s. 39-40.

    HLUBINA, P., LUŇÁČEK, J., CIPRIAN, D., LESŇÁK, M. CHLEBUS, R.: Measurement of thin film thickness by white-light spectral interferometry. In: Annual Proceeding of Science and Technology at VŠB-TUO, 2007, s. 52-55.

    HLUBINA, P., LUŇÁČEK, J., CIPRIAN, D., CHLEBUS, R.: Measurement of group dispersion of isotropic and anisotropic optical elements by white-light spectral interferometry. In: Annual Proceeding of Science and Technology at VŠB-TUO, 2007, s. 48-51.

    CIPRIAN, D., HLUBINA, P.: Measurement of specialty fibers by spectral interferometric techniques. In: Annual Proceeding of Science and Technology at VŠB-TUO, 2007, s. 14-17.

    LUŇÁČEK, J., HLUBINA, P., CIPRIAN, D., LESŇÁK, M., CHLEBUS, R.: White-light interferometric method to measure thickness of thin films. Material Science and Technology, 7, 2007, 7 s. (pouze internetová verze).

    LUŇÁČEK, J., HLUBINA, P., CIPRIAN, D., LESŇÁK, M., CHLEBUS, R.: White-light interferometric method to measure thin films. In Proceedings of Development of Materials Science in Research and Education, 17th Joint Seminar, September 10-14, 2007, Tatranská Štrba, Czech and Slovak Association for Crystal Growth, 2007, s. 38-39.

    LUŇÁČEK, J., HLUBINA, P., CIPRIAN, D., LESŇÁK, M., CHLEBUS, R.: Nondestructive measurement of thickness of silicon oxide thin film on silicon substrate. In: Proceedings of Development of Materials Science in Research and Education, 16th Joint Seminar, September 12-15, 2006, Valtice, Czech and Slovak Association for Crystal Growth, 2006, s. 38-39.


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